CMOS Density Scaling and the CPP×MxP Metric - LinkedIn

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To quantify the density advantage, Intel used a plot of contacted gate (poly) pitch (CPP) times metal pitch as a measure of transistor density.   OneofthemostdebatedsemiconductortopicsinthepastyearhasbeentheclaimmadebyIntelthatunlikefoundryofferingsat16/14nmthatareessentiallya



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